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Johnson Matthey Technol. Rev., 2019, 63, (1), 15

doi:10.1595/205651319x15423782543266

Erratum: Application of Atomic Force Microscopy in Formulation Engineering

A versatile tool for surface analysis

  • Lawrence Shere, Evangelos Liamas§, Zhenyu Jason Zhang*
  • School of Chemical Engineering, University of Birmingham, Edgbaston, Birmingham, B15 2TT, UK
  • §Present address: School of Food Science & Nutrition, University of Leeds, Woodhouse Lane, Leeds, LS2 9JT, UK
  • Jon A. Preece
  • School of Chemistry, University of Birmingham, Edgbaston, Birmingham, B15 2TT, UK
  • *Email: z.j.zhang@bham.ac.uk
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It has come to our attention that the author attribution on the article published in the previous issue of Johnson Matthey Technology Review was incorrect (1).

The corrected author list for the original article appears in this erratum.

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Reference

  1. L. Shere, Z. J. Zhang and J. A. Preece, Johnson Matthey Technol. Rev., 2018, 62, (4), 438 LINK https://www.technology.matthey.com/article/62/4/438-452/
 

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